Monthly Archives: January 2008

Motion Suit Could Simplify Biomechanics Studies

Motion suit eliminates need for multiple camerasAt the 2008 Consumer Electronics Show here in Las Vegas, Xsens Technologies B.V. yesterday demonstrated a motion capture suit that eliminates the need for multiple cameras and optical markers.
Known as the Moven motion capture system, the new suit incorporates three Analog Devices gyroscopic sensors, three accelerometers, three magnetometers and […]

What is NDT ?

Non Destructive Testing 
Non-destructive testing is a descriptive term used for the examination of materials and components to determine surface and subsurface defects in a way that allows such materials to be examined without changing or destroying their original design or structure.
NDT plays a crucial role in everyday life and is necessary to assure safety and reliability. […]

Marking, Micro Material Processing, Pumping And Microsurgery With Ultra-High-Brightness-Laser

High-power diode lasers are well known as reliable and economic light sources in various medical, industrial, and scientific applications. Only the higher beam-parameter-product restricts the use of common diode lasers in some fields.Now, LIMO introduces the prototype LIMO25-C10×10-DL980 High-Power Diode Laser. This 25 Watt high power diode laser emits a 10 x 10 mm beam […]

ConnexLink USB stand-alone transceivers

ConnexLink USB stand-alone transceivers can be set up in minutes to virtually cut the cables between USB devices. The flexibility and price (as low as $99 per unit) allow users to quickly upgrade wired terminals to cordless operation in industrial, commercial, even residential applications.

Specialised Imaging Achieves 3D Visualisation & Measurement Of High-Speed Objects In Flight

Specialised Imaging Ltd. has announced the development of a novel technique that allows engineers, for the first time, to correlate high-speed video data with 3D visualisation and measurement.For high-speed imaging applications such as ballistic trajectory characterisation, space re-entry vehicle development and development of advanced munitions - engineers have traditionally used expensive Doppler radar equipment with […]

NIST Develops Test Method For Key Micromechanical Property

Engineers and researchers designing and building new microelectromechanical systems (MEMS) can benefit from a new test method developed at the National Institute of Standards and Technology (NIST) to measure a key mechanical property of such systems: elasticity. The new method determines the “Young’s modulus” of thin films not only for MEMS devices but also for […]

An “Attractive” Man-Machine Interface: Researchers Use Magnetic Fields, Rather Than Drugs, To Control Cellular Signaling

Researchers at Children’s Hospital Boston have developed a new “nanobiotechnology” that enables magnetic control of events at the cellular level. They describe the technology, which could lead to finely-tuned but noninvasive treatments for disease, in the January issue of Nature Nanotechnology.
Don Ingber, MD, PhD, and Robert Mannix, PhD, of Children’s program in Vascular Biology, in […]

MIT Gas Sensor Is Tiny, Quick

Energy-efficient device could quickly detect hazardous chemicals
MIT research scientist Luis Velasquez-Garcia, left, and Akintunde Ibitayo Akinwande, professor of electrical engineering and computer science, are developing a tiny sensor that can detect hazardous gases, including biochemical warfare agents. Scaling down gas detectors makes them much easier to use in a real-world environment, where they could be […]

Research Sheds Light On The Mechanics Of Gene Transcription

The molecular machinery behind gene transcription — the intricate transfer of information from a segment of DNA to a corresponding strand of messenger RNA — isn’t stationed in special “transcription factories” within a cell nucleus, according to Cornell researchers. Instead, the enzyme RNA polymerase II (Pol II) and other key molecules can assemble at the […]

Veeco Introduces New InSight 3D Atomic Force Microscope

Woodbury, NY — Veeco Instruments Inc., announced the introduction of its new InSight 3D Automated Atomic Force Microscope (AFM) Platform, the only metrology system available with the accuracy and precision required for non-destructive, high resolution three-dimensional (3D) measurements of critical 45nm and 32nm semiconductor features, with the speed to qualify as a true fab tool. […]