Archive for the ‘Measurement’ Category.

Closest Look Ever At Graphene

Closest Look Ever At Graphene

Hailed as the world’s most powerful transmission electron microscope, TEAM 0.5 is living up to expectations. Using TEAM 0.5 (TEAM stands for Transmission Electron Aberration-corrected Microscope), researchers with the U.S. Department of Energy’s Lawrence Berkeley National Laboratory (Berkeley Lab) have produced stunning images of individual carbon atoms in graphene, the two-dimensional crystalline form of carbon that is highly prized by the electronics industry. These first time ever images were recorded at Berkeley Lab’s National Center for Electron Microscopy (NCEM), a DOE national user facility that is a premier center for electron microscopy and microcharacterization. TEAM 0.5, its newest instrument, is capable of producing images with half-angstrom resolution, which is less than the diameter of a single hydrogen atom. “Simply put, TEAM 0.5 is the best transmission electron microscope in the world, representing a quantum leap forward in instrumentation,” said physicist Alex Zettl who led this research. “Having the ability to see, basically in real time, each and every individual atom in a sample is unbelievably useful and the images we can now see have been jaw-dropping for even the most seasoned electron microscopists. TEAM 0.5 is pushing transmission electron microscopy to a new level.” Zettl holds joint appointments with Berkeley Lab’s Materials Sciences Division (MSD) and the Physics Department at the University of California’s Berkeley campus, where he is the director of the Center of Integrated Nanomechanical Systems. Collaborating with him on this graphene imaging project were Jannik Meyer, also with Berkeley Lab’s Materials Sciences Division, and Christian Kisielowski, Rolf Erni and Marta Rossell of NCEM. Their results were published in the journal Nanoletters, in a paper entitled: “Direct imaging of lattice atoms and topological defects in graphene membranes.” The properties of solid materials stem from the arrangement of their constituent atoms in the solid’s crystal structure. While technologies such as electron and x-ray crystallography can reveal the atomic geometry of a crystal, they do not identify the precise location and position of each individual atom. When the dimensions of a material shrink to the nanoscale, the location and position of each individual atom becomes critically important, as Zettl explains. “Think of the steel re-bars on a three-dimensional structure, like a jungle gym,” he said. “If a small piece of re-bar is rusted out somewhere in the center of the gym, it won’t likely have much affect on the overall properties of the structure. In a two-dimensional structure, however, a rusted out segment becomes a much bigger problem, and in a one-dimensional structure, i.e., a single re-bar, a rusted out segment can be catastrophic, causing the entire structure to fail.

On a nanoscale crystal, one missing atom or some other defect in the arrangement can result in catastrophic failure.” Graphene is especially sensitive to defects in its atomic structure. Consisting of a single-layered sheet of carbon atoms arranged in hexagons, like a sheet of chicken wire with an atom at each nexus, graphene features extraordinary electrical, mechanical and thermal properties that could enable it to serve in a broad array of carbon-based electronic devices. For the enormous promises of graphene to be fulfilled, however, scientists need a much better understanding of how specific types of defects in the crystal structure, including those that change location over time, affect its properties.

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Test And Measurement Industry Trends Toward Software-Defined Instrumentation

Test engineers in industries ranging from aerospace and defense to consumer electronics are facing the challenge of testing increasingly complicated designs with shrinking timelines and budgets. To address these issues, engineers and scientists are incorporating new test and measurement technologies that are capable of meeting complex design requirements without raising costs. National Instruments (NI) has identified five trends it anticipates will significantly influence the test and measurement industry over the next three years.”Companies are turning to the latest technologies including PXI, FPGAs and multicore processors to develop high-performance test systems that can meet consumer demand for higher-quality products,” said Eric Starkloff, National Instruments director of test product marketing.

FPGA Board

“Fortunately, more technology vendors are developing industry-standard tools capable of solving problems that previously depended on expensive, dedicated test systems.”

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Visualizing Atomic-Scale Acoustic Waves In Nanostructures

Acoustic waves play many everyday roles – from communication between people to ultrasound imaging. Now the highest frequency acoustic waves in materials, with nearly atomic-scale wavelengths, promise to be useful probes of nanostructures such as LED lights.

Visualizing Atomic-Scale Acoustic Waves In Nanostructures

However, detecting them isn’t so easy.

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Lab-on-a-Chip Made of Paper

Lab-on-a-Chip

Color coding: This prototype of a new paper diagnostic test from Harvard University analyzes the glucose (left well) and protein (right well) content of urine; the top well is a control for the glucose assay. The beige part of the test paper has been treated with a hydrophobic polymer that channels the liquid into the wells. In this test, the paper was dipped in an artificial urine solution that contained glucose and a protein extracted from cow blood.

By taking advantage of the natural movement of liquid through paper, researchers at Harvard’s Whitesides Research Group may have found a way to make microfluidics technology much cheaper. The result could be disposable diagnostic tests simple and abundant enough for use in the developing world.

The field of microfluidics deals with the precise manipulation of tiny quantities of liquid. One of its most promising applications is the so-called lab-on-a-chip, which can work with much smaller fluid samples than larger devices require, potentially allowing for more portable diagnostic tools. But existing microfluidic chips are generally made from comparatively expensive materials like silicon, glass, or plastic and have tiny pumps and valves that can be difficult to manufacture.

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Silicon Low Noise Digital Inertial Measurement Unit Landmark 20 IMU

Landmark 20 IMU

The all new LandMark20 MEMS IMU is a silicon low noise digital Inertial Measurement Unit (IMU) that provides internally temperature compensated RS485 output of delta velocity and delta theta.
Features:

  • Low Noise Silicon MEMS Digital IMU
  • Low Gyro Noise 0.028º/sec/?Hz
  • Fully Temperature Compensated Bias and Scale Factor
  • Compensated G-Sensitivity and Misalignment
  • In Run Gyro Bias 6° to 60°/hour typical
  • Low Power < 1/2 watt typical
  • Light Weight 113 grams
  • Small Size < 67.5cm3/4.1in3
  • Low Voltage +3.0 to 4.2V (single sided power)
  • Bandwidth 100 Hz (user selectable)
  • RS485 Output 200 Hz (user selectable)
  • Bandwidth Filtering Capability
  • Vibration Isolation
  • Precision Alignment
  • 3 Internal Temp. Sensors
  • Self Test
  • Shock Resistant
  • Long Life
  • Export Classification: Commerce ECCN7A994 Pending

The LandMark20 IMU is ideal for applications requiring improved performance MEMS gyros, but also needing ultra low power consumption, small size, light weight and no inherent wear out modes for long life. The signature feature of the LandMark20 IMU is the improved gyro performance. The low noise gyros enable precision measurement and improved in-run and bias over temperature. The IMU’s performance is optimized with fully temperature compensated bias and scale factor and compensated misalighnment and g-sensitivity. The rate outputs are free from bias steps and linear outputs are without acceleration hysteresis. The unit is highly durable and can withstand environmental vibration and shock typically associated with commerical aircraft requirements.

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MEMS accelerometer wave approaching

MEMS accelerometer wave approaching, says ABI April 15, 2008 — The Nintendo Wii’s motion-sensing remote control and the Apple iPhone’s self-orienting display represent the advance wave of what will be a rising tide of new and innovative uses for tiny MEMS accelerometers, according to ABI Research.

“In the very creative consumer electronics market,” says ABI analyst Doug McEuen, “the sky’s the limit. The growth rate of this market will be determined by the imaginations of designers as they think up innovative and unexpected ways to incorporate accelerometers into new devices. The arrival of another wildly popular consumer product that sells large numbers worldwide could give this market a significant boost.”

“Other major game console manufacturers are following Nintendo’s lead in seeking accelerometer applications for their next-generation products,” he says. “But games are only one use for these specialized devices. They are already widely used in automotive airbag systems (where the high sales volume has helped drive down prices.) They can measure vibration in industrial machinery; they are used in exercise step-counters, and we will see them in growing numbers of other phones and PDAs.”
A relative handful of manufacturers share this high-potential market. A “big three” — Analog Devices, Freescale, and ST Microelectronics — are joined by just a few others, including OKI Semiconductor and Hitachi Metals America.

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Industrial Wireless Modems Come of Age

From Tesla and Marconi’s electric coils and arcs to the youngster’s model car that speeds or stops at the nudge of the controls, we’ve had a fascination with wireless control and communication.

And with the explosion over the last 25 years of wireless from cell phones to Internet, interest in industrial uses has grown. This could easily afflict anyone from refinery or public works managers to manufacturing techs with equipment monitoring and control needs.

wp_industrialwirelessmodems.gif

Regardless of the potential, early attempts to adapt wireless technology to industrial applications met with limited success.

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Zelscope Oscilloscope and spectrum analyzer Software

Zelscope screenshot

Zelscope is a Windows software that converts your PC into a dual-trace storage oscilloscope and spectrum analyzer. It uses your computer’s sound card as analog-to-digital converter, presenting a real-time waveform or spectrum of the signal - which can be music, speech, or output from an electronic circuit. Zelscope features the interface of a traditional oscilloscope, with conventional gain, offset, timebase, and trigger controls. As a real-time spectrum analyzer, Zelscope can display the amplitude and phase components of the spectrum.

Download evaluation version of Zelscope

Download a 14-day evaluation version of Zelscope here (720 kB)

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